Surface Analytical Methods: Applications to Materials Science

Dr. Filippo Radicati di Brozolo, Western Digital, California (retired)

English

The course aims at providing an introduction to the main surface analytical methods and their application to the study of materials.
The following topics will be addressed.

  • Introduction to Surface Analysis: definition of solid surface stimulation of solid materials with different means, photons, charged particles; analysis of emitted signals by means of electron spectroscopies; description of surface- capable electron spectroscopic techniques, their relationships with Electron Microscopy; Auger Electron Spectroscopy as a by-product of Secondary Electron Microscopy.
  • X-ray stimulation of surfaces, and related analytical techniques: XPS/ESCA (X-ray Photoelectron Spectroscopy/Electron Spectroscopy for Chemical Analysis).
  • Advanced techniques related to XPS: synchrotron radiation as X-ray source; analytical applications of XAS, EXAFS and XANES; overview of Near-Field techniques, tip-enhanced imaging and spectroscopy techniques (PiFM, NSOM etc)
  • Ion spectroscopies: stimulation of secondary ions from solid surfaces; SIMS and MALDI-TOF.

1 CFU / 8 hours

January 2024;

Jan 15th (16.30 - 18.30)
Jan 16th (16.30 - 18.30)
Jan 17th (16.30 - 18.30)
Jan 18th (16.30 - 18.30)

(eventually also on Jan 19th, 16.30-18.30)

Online only, streamed at https://unimib.webex.com/unimib/j.php?MTID=m8a24c30defe1174ead6cf5ce9a1ba711

ISTRUZIONE DI QUALITÁ

Surface Analytical Methods: Applications to Materials Science

Dr. Filippo Radicati di Brozolo, Western Digital, California (retired)

English

The course aims at providing an introduction to the main surface analytical methods and their application to the study of materials.
The following topics will be addressed.

  • Introduction to Surface Analysis: definition of solid surface stimulation of solid materials with different means, photons, charged particles; analysis of emitted signals by means of electron spectroscopies; description of surface- capable electron spectroscopic techniques, their relationships with Electron Microscopy; Auger Electron Spectroscopy as a by-product of Secondary Electron Microscopy.
  • X-ray stimulation of surfaces, and related analytical techniques: XPS/ESCA (X-ray Photoelectron Spectroscopy/Electron Spectroscopy for Chemical Analysis).
  • Advanced techniques related to XPS: synchrotron radiation as X-ray source; analytical applications of XAS, EXAFS and XANES; overview of Near-Field techniques, tip-enhanced imaging and spectroscopy techniques (PiFM, NSOM etc)
  • Ion spectroscopies: stimulation of secondary ions from solid surfaces; SIMS and MALDI-TOF.

1 CFU / 8 hours

January 2024;

Jan 15th (16.30 - 18.30)
Jan 16th (16.30 - 18.30)
Jan 17th (16.30 - 18.30)
Jan 18th (16.30 - 18.30)

(eventually also on Jan 19th, 16.30-18.30)

Online only, streamed at https://unimib.webex.com/unimib/j.php?MTID=m8a24c30defe1174ead6cf5ce9a1ba711

Staff

    Manager

  • Francesco Cimbro Mattia Montalenti
  • Teacher

  • Cristiana Di Valentin
    Cristiana Di Valentin

Enrolment methods

Manual enrolments