Course Syllabus
Titolo
Surface Analytical Methods: Applications to Materials Science
Docente(i)
Dr. Filippo Radicati di Brozolo, Western Digital, California (retired)
Lingua
English
Breve descrizione
The course aims at providing an introduction to the main surface analytical methods and their application to the study of materials.
The following topics will be addressed.
- Introduction to Surface Analysis: definition of solid surface stimulation of solid materials with different means, photons, charged particles; analysis of emitted signals by means of electron spectroscopies; description of surface- capable electron spectroscopic techniques, their relationships with Electron Microscopy; Auger Electron Spectroscopy as a by-product of Secondary Electron Microscopy.
- X-ray stimulation of surfaces, and related analytical techniques: XPS/ESCA (X-ray Photoelectron Spectroscopy/Electron Spectroscopy for Chemical Analysis).
- Advanced techniques related to XPS: synchrotron radiation as X-ray source; analytical applications of XAS, EXAFS and XANES; overview of Near-Field techniques, tip-enhanced imaging and spectroscopy techniques (PiFM, NSOM etc)
- Ion spectroscopies: stimulation of secondary ions from solid surfaces; SIMS and MALDI-TOF.
CFU / Ore
1 CFU / 8 hours
Periodo di erogazione
26/01/2023 (16.30 - 18.30)
27/01/2023 (16.30 - 18.30)
30/01/2023 (16.30 - 18.30)
31/01/2023 (16.30 - 18.30)
EDIT: POSTPONED TO 14-17 March 2023, same time.
Sustainable Development Goals
Title
Surface Analytical Methods: Applications to Materials Science
Teacher(s)
Dr. Filippo Radicati di Brozolo, Western Digital, California (retired)
Language
English
Short description
The course aims at providing an introduction to the main surface analytical methods and their application to the study of materials.
The following topics will be addressed.
- Introduction to Surface Analysis: definition of solid surface stimulation of solid materials with different means, photons, charged particles; analysis of emitted signals by means of electron spectroscopies; description of surface- capable electron spectroscopic techniques, their relationships with Electron Microscopy; Auger Electron Spectroscopy as a by-product of Secondary Electron Microscopy.
- X-ray stimulation of surfaces, and related analytical techniques: XPS/ESCA (X-ray Photoelectron Spectroscopy/Electron Spectroscopy for Chemical Analysis).
- Advanced techniques related to XPS: synchrotron radiation as X-ray source; analytical applications of XAS, EXAFS and XANES; overview of Near-Field techniques, tip-enhanced imaging and spectroscopy techniques (PiFM, NSOM etc)
- Ion spectroscopies: stimulation of secondary ions from solid surfaces; SIMS and MALDI-TOF.
CFU / Hours
1 CFU / 8 hours
Teaching period
26/01/2023 (16.30 - 18.30)
27/01/2023 (16.30 - 18.30)
30/01/2023 (16.30 - 18.30)
31/01/2023 (16.30 - 18.30)
EDIT: POSTPONED TO 13-16 March 2023, same time.
