The aim of the course is to provide the basic principles of scanning probe microscopy (SPM) and related techniques, a summary of the methods applied in nanosciences, and basic knowledge of image artifact recognition and image handling.

Lecture I: Basic concepts of nano-probe/surface interaction

Lecture II: Signal monitoring in SPM techniques and image reproduction

Lecture III: Case studies in nanosciences: functional nanostructures, nanotribology, and mineral surface physiscs

Lecture IV, V, VI: Image handling: practical session with freeware software.

Expected outcome: Knowledge of potentiality of SPM techniques applied in cross-disciplinary fields. Acquisition of basic skills in interpreting and handling of false-colour SPM images.

Suggested years of attendance: I and II

Evaluation: NO